Q:
What are some commonly used characterization terms?





A:

The following glossary includes a few of the
acrynoms and terms most frequently encountered.


  • AFM:  Atomic Force Microscopy

  • AES:  Auger Electron Spectrometry
             also known as SAM or Scanning Auger Micro analysis

  • DSC:  Differential Scanning Calorimetry

  • EDX:  Energy Dispersive X-Ray Analysis

  • EDAX/EDS:  Energy Dispersive Spectroscopy

  • ESCA:  Electron Spectroscopy Chemical Analysis
               also known as XRPS or X-Ray Photoelectron
               Spectropy

  • FTIR:  Fourier Transform Infrared Spectroscopy

  • IA:  Image Analysis

  • RGA:  Residual Gas Analysis

  • SAM:  Scanning Auger Micro-analysis

  • SEM:  Scanning Electron Microscopy

  • SIMS:  Secondary Ion Mass Spectroscopy

  • TGA:  Thermo Gravimetric Analysis

  • TOF:  Time of Flight

  • TEM:  Transmission Electron Microscopy

  • XRD:  X-ray Diffraction

  • XRF:  X-ray Fluorescence