The following glossary includes a few of the
acrynoms and terms most frequently encountered.

• AFM:  Atomic Force Microscopy
  
  
• AES:  Auger Electron Spectrometry
           also known as SAM or Scanning Auger Micro analysis
  
  
• DSC:  Differential Scanning Calorimetry
  
  
• EDX:  Energy Dispersive X-Ray Analysis
  
  
• EDAX/EDS:  Energy Dispersive Spectroscopy
  
  
• ESCA:  Electron Spectroscopy Chemical Analysis
             also known as XRPS or X-Ray Photoelectron
             Spectropy
  
  
• FTIR:  Fourier Transform Infrared Spectroscopy
  
  
• IA:  Image Analysis
  
  
• RGA:  Residual Gas Analysis
  
  
• SAM:  Scanning Auger Micro-analysis
  
  
• SEM:  Scanning Electron Microscopy
  
  
• SIMS:  Secondary Ion Mass Spectroscopy
  
  
• TGA:  Thermo Gravimetric Analysis
  
  
• TOF:  Time of Flight
  
  
• TEM:  Transmission Electron Microscopy
  
  
• XRD:  X-ray Diffraction
  
  
• XRF:  X-ray Fluorescence